Advanced TEM Characterization for the Materials Scientist

Advances in imaging performance and analytical capabilities, combined with the way in which detectors are accessed, have led to the ability for Materials Scientists, rather than Electron Microscopists, to obtain the highest quality data for their characterization needs at the sub-nanometer scale.

Using this technology has enabled even the most novice users at EPFL (École Polytechnique Fédérale de Lausanne, Switzerland) to acquire high-quality data without arduous and time-consuming alignment procedures. This ease-of-use has sped up the experimental iteration cycle on the TEM and leads to, more importantly, EPFL’s Materials Science students and researchers finding more time to spend on interpreting and analyzing the data in order to make sound scientific conclusions.

In this webinar, we will introduce a number of techniques that are available on the latest generation of microscopes and share with you the exciting experiences of using this technology in the Interdisciplinary Centre for Electron Microscopy at EPFL. We will also showcase our quick and easy workflow that leads to the acquisition of HRTEM and HRSTEM images, in addition to sharing a number of results recorded with the 4k x 4k TEM camera. These features have already proven beneficial to a number of research groups at EPFL working on nanostructured catalysis materials.

Additionally, we will present results obtained on nanostructured materials using the advanced EDS system that enables the acquisition of chemical data sets in 3D.

  • Hear from leading researchers on how productivity in their university microscopy center has increased significantly
  • Learn about the application of the latest technologies to the characterization of nanostructured materials
  • Discuss your materials characterization challenges with experts



Thomas LaGrange,Staff Scientist at the Interdisciplinary Centre for Electron Microscopy (CIME), École Polytechnique Fédérale de Lausanne, Switzerland
Marco Cantoni, Manager of the Interdisciplinary Centre for Electron Microscopy (CIME), École Polytechnique Fédérale de Lausanne, Switzerland
Yuri Rikers, Senior Applications Specialist TEM, FEI Company
Dr. Baptiste Gault (Moderator), Materials Science Publisher