This course provides an understanding of the concepts, instrumentation, and applications of the rapidly expanding field of scanning probe microscopy (SPM). AFM and STM will be covered extensively; the course will also feature advanced techniques for imaging and measuring electronic, magnetic and mechanical properties, including nanoindentation. The theory of operation for both imaging and spectroscopy will be addressed, with attention paid to instrumental artifacts and methods to avoid them. The lectures will cover a wide range of applications in the physical and biological sciences and in engineering. Hands-on laboratory exercises are used extensively throughout the course. Participants are encouraged to bring samples that can be characterized with the assistance of the lecturers and equipment vendors.

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