Electron microscopes are by far the most versatile instruments for characterization of materials on multiple length scales – ranging from the micrometer down to the atomic scale. Rapid developments in electron optics and detector systems have led to extreme high flexibility in their current use, enabling to adjust the instruments to the specific requirements of various materials and applications. In particular, the acceleration voltage can be flexibly and accurately tuned over a wide range - in both TEM and STEM mode – e.g. to optimize contrast at reduced charging or beam damage without compromising resolution.
By opening the pole piece gap in aberration-corrected (S)TEM instruments, advanced in situ studies of materials processes and properties have been made possible. Combining these developments with state-of-the-art FIB-SEM technology for sample preparation and manipulation allows scientists the most complete set of characterization workflows for modern materials research.
Using these characterization workflows has enabled researchers from different disciplines at the University of Erlangen-Nürnberg to contribute to the development of novel materials and processes for emerging key technologies such as information and communication technology, catalysis, energy and transportation and explore the application of novel in situ and scattering techniques in materials research.
In this webinar, we will illustrate the most recent developments in aberration-corrected TEM/STEM instruments in combination with state-of-the-art FIB/SEM technology and their application in different fields of materials research. We will address a variety of materials classes and devices, including nanoparticles, organic solar cells, porous structures and high-temperature materials and also explore in situ materials characterization studies.
- Hear from leading experts how state-of-the-art TEM and FIB-SEM technology work hand in hand in modern materials research
- Learn how different operation and imaging modes can be advantageously combined to get the most information about your material
- Hear about the opportunities of modern TEM/STEM instruments for in situ studies of materials processes and properties
- Discuss your materials characterization challenges with experts
Speakers:
Christian Maunders, Product Marketing Manager, FEI
Erdmann Spiecker, Professor and Head of Institute of Micro- and Nanostructure Research & Center for Nanoanalysis and Electron Microscopy (CENEM), University of Erlangen-Nürnberg, Germany
Joe d’Angelo, (Moderator), Executive Publisher.
Thank you for registering, and enjoy the on demand version of the webinar, below!