The high-quality ZEISS optics allow topographical measurements to be performed at up to 117 frames per second. Step heights from approx. 20 nm up to the millimetre range are detected at a depth of focus previously only possible with the scanning electron microscope. These attributes will be useful in the examination of many materials, including LCD panels, semiconductors, colour filters, glass, polymers and metals.

Despite the new microscope’s outstanding functionality, it is easy to operate, with all the major functions and measurement parameters controlled through the large, LCD control panel. This comprehensive control is complemented by the intuitive control software, which provides many analysis options, including the measurement of roughness, evaluation of layer thickness and particle analysis.